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Fairchild Semiconductor Electronic Components Datasheet

IRF750 Datasheet

Advanced Power MOSFET

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IRF750 pdf
$GYDQFHG 3RZHU 026)(7
FEATURES
Avalanche Rugged Technology
Rugged Gate Oxide Technology
Lower Input Capacitance
Improved Gate Charge
Extended Safe Operating Area
Lower Leakage Current: 10µA (Max.) @ VDS = 400V
Low RDS(ON): 0.254(Typ.)
Absolute Maximum Ratings
Symbol
VDSS
ID
IDM
VGS
EAS
IAR
EAR
dv/dt
PD
TJ , TSTG
TL
Characteristic
Drain-to-Source Voltage
Continuous Drain Current (TC=25°C)
Continuous Drain Current (TC=100°C)
Drain Current-Pulsed
(1)
Gate-to-Source Voltage
Single Pulsed Avalanche Energy
(2)
Avalanche Current
(1)
Repetitive Avalanche Energy
(1)
Peak Diode Recovery dv/dt
(3)
Total Power Dissipation (TC=25°C)
Linear Derating Factor
Operating Junction and
Storage Temperature Range
Maximum Lead Temp. for Soldering
Purposes, 1/8 from case for 5-seconds
Thermal Resistance
Symbol
RθJC
RθCS
RθJA
Characteristic
Junction-to-Case
Case-to-Sink
Junction-to-Ambient
IRF750
BVDSS = 400 V
RDS(on) = 0.3
ID = 15 A
TO-220
1
2
3
1.Gate 2. Drain 3. Source
Value
400
15
9.5
60
±30
1157
15
15.6
4.0
156
1.25
- 55 to +150
300
Units
V
A
A
V
mJ
A
mJ
V/ns
W
W/°C
°C
Typ.
--
0.5
--
Max.
0.8
--
62.5
Units
°C/W
Rev. B
©1999 Fairchild Semiconductor Corporation


Fairchild Semiconductor Electronic Components Datasheet

IRF750 Datasheet

Advanced Power MOSFET

No Preview Available !

IRF750 pdf
IRF750
1&+$11(/
32:(5 026)(7
Electrical Characteristics (TC=25°C unless otherwise specified)
Symbol
BVDSS
BV/TJ
VGS(th)
IGSS
IDSS
RDS(on)
gfs
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
Characteristic
Min. Typ. Max. Units
Test Condition
Drain-Source Breakdown Voltage
Breakdown Voltage Temp. Coeff.
Gate Threshold Voltage
Gate-Source Leakage , Forward
Gate-Source Leakage , Reverse
Drain-to-Source Leakage Current
Static Drain-Source
On-State Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
400 -- -- V
-- 0.46 -- V/°C
2.0 -- 4.0 V
-- -- 100 nA
-- -- -100
-- -- 10
-- -- 100 µA
-- -- 0.3
-- 11.1 --
-- 2140 2780
-- 305 350 pF
-- 134 155
VGS=0V,ID=250µA
ID=250µA See Fig 7
VDS=5V,ID=250µA
VGS=30V
VGS=-30V
VDS=400V
VDS=320V,TC=125°C
VGS=10V,ID=7.5A
(4)
VDS=50V,ID=7.5A
(4)
VGS=0V,VDS=25V,f =1MHz
See Fig 5
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
-- 20 50
-- 22 55
VDD=200V,ID=17A,
-- 100 210 ns RG=6.2
See Fig 13 (4) (5)
-- 32 75
Total Gate Charge
Gate-Source Charge
Gate-Drain ( Miller ) Charge
-- 101 131
VDS=320V,VGS=10V,
-- 14 -- nC ID=17A
-- 51.5 --
See Fig 6 & Fig 12 (4) (5)
Source-Drain Diode Ratings and Characteristics
Symbol
IS
ISM
VSD
trr
Qrr
Characteristic
Continuous Source Current
Pulsed-Source Current
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Min. Typ. Max. Units
Test Condition
--
(1) --
-- 15
-- 60
Integral reverse pn-diode
A
in the MOSFET
(4) -- -- 1.5 V TJ=25°C,IS=15A,VGS=0V
-- 385 -- ns TJ=25°C,IF=17A
-- 4.85 -- µC diF/dt=100A/µs
(4)
Notes;
(1) Repetitive Rating: Pulse Width Limited by Maximum Junction Temperature
(2) L=9mH, IAS=15A, VDD=50V, RG=27, Starting TJ =25°C
(3) ISD 17A, di/dt 250A/µs, VDD BVDSS , Starting TJ =25°C
(4) Pulse Test: Pulse Width = 250µs, Duty Cycle 2%
(5) Essentially Independent of Operating Temperature


Part Number IRF750
Description Advanced Power MOSFET
Maker Fairchild Semiconductor
Total Page 7 Pages
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