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Toshiba Electronic Components Datasheet

TLP3215 Datasheet

LOGIC IC TESTERS / MEMORY TESTERS

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TLP3215 pdf
TOSHIBA PHOTOCOUPLER PHOTO RELAY
TLP3215
TLP3215
MEASUREMENT INSTRUMENTS
LOGIC IC TESTERS / MEMORY TESTERS
BOARD TESTERS / SCANNERS
The TOSHIBA TLP3215 is a super small-outline photorelay, suitable for
surface-mount assembly. The TLP3215 consists of a GaAs
www.DataSheeti4nUfr.caormed-emitting diode optically coupled to a photo-MOS FET and
housed in a 4-pin package.
The TLP3215 features low CR multiplication and especially low On-state
resistance, allowing high ON-state current.
Its characteristics also include low OFF-state current and low output pin
capacitance, enabling it to be used in high-frequency measuring
instruments.
Features
4 pin SSOP (SSOP4)
1-Form-A
Peak Off-State Voltage
Trigger LED Current
On-State Current
On-State Resistance
Output Capacitance
Isolation Voltage
: 1.8 mm high, 1.27 mm pitch
: 40 V (MIN.)
: 4 mA (MAX.)
: 300 mA (MAX.)
: 1.5Ω(MAX.), 1.0Ω(TYP.)
: 14 pF (MAX.), 10 pF (TYP.)
: 1500 Vrms (MIN.)
Pin Configuration (top view)
4.2
φ1.4
3.5
0.2 3.8
0.46±0.2
Unit: mm
1.7
0.2 1.27
2.04
0.3
JEDEC
JEITA
TOSHIBA
Weight: 0.03 g
11-2A1
14
2
1 : ANODE
2 : CATHODE
3 : DRAIN
4 : DRAIN
3
1 2007-10-01


Toshiba Electronic Components Datasheet

TLP3215 Datasheet

LOGIC IC TESTERS / MEMORY TESTERS

No Preview Available !

TLP3215 pdf
TLP3215
Absolute Maximum Ratings (Ta = 25°C)
CHARACTERISTIC
SYMBOL
RATING
UNIT
Forward Current
Forward Current Derating (Ta >= 25°C)
Reverse Voltage
Junction Temperature
Off-State Output Terminal Voltage
On-State Current
On-State Current Derating (Ta >= 25°C)
Junction Temperature
Storage Temperature Range
www.DataSheet4U.cOopmerating Temperature Range
Lead Soldering Temperature (10 s)
Isolation Voltage (AC, 1 minute, R.H. <= 60%) (NOTE1)
IF
ΔIF/°C
VR
Tj
VOFF
ION
ΔION/°C
Tj
Tstg
Topr
Tsol
BVS
50
0.5
5
125
40
300
3.0
125
40~125
20~85
260
1500
mA
mA/°C
V
°C
V
mA
mA/°C
°C
°C
°C
°C
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(NOTE1) : Device considered a two-terminal device : Pins 1 and, 2 shorted together, and pins 3 and 4 shorted
together.
Caution
This device is sensitive to electrostatic discharge. When using this device, please ensure that all tools and
equipment are earthed.
This device is applying super small package which is free for Moisture-Proof packing. However, the application of
this device is premised on use under controlled environmental condition like as measuring instrument. It is necessary to
take precautions of storage condition and operating environmental condition.
Recommended Operating Conditions
CHARACTERISTIC
SYMBOL MIN. TYP. MAX. UNIT
Supply Voltage
Forward Current
On-State Current
Operating Temperature
VDD
IF
ION
Topr
⎯ ⎯ 32 V
10 30 mA
⎯ ⎯ 300 mA
25 60 °C
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this
product, please confirm specified characteristics shown in this document.
Individual Electrical Characteristics (Ta = 25°C)
CHARACTERISTIC
Forward Voltage
Reverse Current
Capacitance
Off-State Current
SYMBOL
VF
IR
CT
IOFF
TEST CONDITION
IF = 10 mA
VR = 5 V
V = 0, f = 1 MHz
VOFF = 30 V, Ta = 50°C
MIN.
1.0
TYP.
1.15
15
MAX.
1.3
10
UNIT
V
μA
pF
1000
pA
Capacitance
COFF
V = 0, f = 100 MHz, t < 1 s
10 14 pF
2 2007-10-01


Part Number TLP3215
Description LOGIC IC TESTERS / MEMORY TESTERS
Maker Toshiba Semiconductor
Total Page 7 Pages
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