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A25L032 - Dual-I/O Serial Flash Memory

General Description

in Part Numbering Scheme P31: Modify Read Device Identification P40: Remove the min.

value of ICC1 and ICC2 P32: ID code error correction P39: Change Data Retention and Endurance value from Max.

to Min.

Key Features

  • Change tSE(typ. ) from 150ms to 80ms Change tSE(max. ) from 280ms to 200s Change tBE(typ,) from 0.7s to 0.5s Change tCE(typ,) from 40s to 32s Add 8-pin WSON (6.
  • 5mm) package type P40: Change ICC6 & ICC7(max. ) from 15mA to 25ma Remove SOP 16L (300mil) package type P.1: Add “AEC-Q100 Grade 3.

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Datasheet Details

Part number A25L032
Manufacturer AMIC
File Size 759.03 KB
Description Dual-I/O Serial Flash Memory
Datasheet download datasheet A25L032 Datasheet

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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A25L032 Series 32Mbit Low Voltage, Dual-I/O Serial Flash Memory with 100MHz Uniform 4KB Sectors Document Title 32Mbit, Low Voltage, Dual-I/O Serial Flash Memory with 100MHz Uniform 4KB Sectors Revision History Rev. No. 0.0 0.1 0.2 0.3 0.4 0.5 1.0 1.1 1.2 1.3 1.4 1.5 History Initial issue Spec. change for new commands Add packing description in Part Numbering Scheme P31: Modify Read Device Identification P40: Remove the min. value of ICC1 and ICC2 P32: ID code error correction P39: Change Data Retention and Endurance value from Max. to Min. Change tPP, tSE, tBE and tCE data values Final version release P1: Add “Provide 64Bytes Security ID (application note is available by request)” in Features Change tSE(typ.) from 150ms to 80ms Change tSE(max.