Features
• Low Voltage and Standard Voltage Operation
– 2.7 (VCC = 2.7V to 5.5V)
– 1.8 (VCC = 1.8V to 5.5V)
• Internally Organized 128 x 8
• Two-wire Serial Interface
• Bidirectional Data Transfer Protocol
• 400 kHz (1.8V) and 1 MHz (2.5V, 2.7V, 5V) Compatibility
• 4-Byte Page Write Mode
• Self-Timed Write Cycle (5 ms max)
• High Reliability
– Endurance: 1 Million Write Cycles
– Data Retention: 100 Years
• Automotive Grade, Extended Temperature and Lead-Free/Halogen-Free
Devices Available
• 8-lead PDIP, 8-lead JEDEC SOIC, 5-lead SOT23 and 8-lead TSSOP Packages
• Die Sales: Wafer Form, Waffle Pack, and Bumped Wafers
• Access to One Additional Page Upon Request
Two-wire Serial
EEPROM
1K (128 x 8)
AT24C11
Description
The AT24C11 provides 1024 bits of serial electrically erasable and programmable
read only memory (EEPROM) organized as 128 words of 8 bits each. The device is
optimized for use in many industrial and commercial applications where low power
and low voltage operation are essential. The AT24C11 is available in space saving
8-lead PDIP, 8-lead JEDEC SOIC, 5-lead SOT23 and 8-lead TSSOP packages and is
accessed via a two-wire serial interface. In addition, the entire family is available in
2.7V (2.7V to 5.5V) and 1.8V (1.8V to 5.5V) versions.
Table 0-1.
Pin Name
NC
SDA
SCL
TEST
Pin Configuration
Function
No Connect
Serial Data
Serial Clock Input
Test Input (GND or VCC)
NC
NC
NC
GND
8-lead TSSOP
18
27
36
45
8-lead SOIC
VCC
TEST
SCL
SDA
NC
NC
NC
GND
1
2
3
4
8 VCC
7 TEST
6 SCL
5 SDA
8-lead PDIP
NC
NC
NC
GND
1
2
3
4
8 VCC
7 TEST
6 SCL
5 SDA
SCL
GND
SDA
5-lead SOT23
1 5 VCC
2
3 4 TEST
Note: Not recommended for new
design; please refer to
AT24C01B datasheet.
Rev. 3409G–SEEPR–8/07
