X7R Dielectric

Specifications and Test Methods

Parameter/Test

Operating Temperature Range

Capacitance

Dissipation Factor

Insulation Resistance

Dielectric Strength

Resistance to

Flexure

Stresses

Appearance

Capacitance

Variation

Dissipation

Factor

Insulation

Resistance

Solderability

Resistance to

Solder Heat

Thermal

Shock

Load Life

Load

Humidity

Appearance

Capacitance

Variation

Dissipation

Factor

Insulation

Resistance

Dielectric

Strength

Appearance

Capacitance

Variation

Dissipation

Factor

Insulation

Resistance

Dielectric

Strength

Appearance

Capacitance

Variation

Dissipation

Factor

Insulation

Resistance

Dielectric

Strength

Appearance

Capacitance

Variation

Dissipation

Factor

Insulation

Resistance

Dielectric

Strength

X7R Specification Limits

-55ºC to +125ºC

Within specified tolerance

≤ 2.5% for ≥ 50V DC rating

≤ 3.0% for 25V DC rating

≤ 3.5% for 25V and 16V DC rating

≤ 5.0% for ≤ 10V DC rating

100,000MΩ or 1000MΩ - μF,

whichever is less

No breakdown or visual defects

No defects

≤ ±12%

Meets Initial Values (As Above)

Measuring Conditions

Temperature Cycle Chamber

Freq.: 1.0 kHz ± 10%

Voltage: 1.0Vrms ± .2V

Charge device with rated voltage for

120 ± 5 secs @ room temp/humidity

Charge device with 300% of rated voltage for

1-5 seconds, w/charge and discharge current

limited to 50 mA (max)

Note: Charge device with 150% of rated

voltage for 500V devices.

Deflection: 2mm

Test Time: 30 seconds

1mm/sec

≥ Initial Value x 0.3

≥ 95% of each terminal should be covered

with fresh solder

No defects, <25% leaching of either end terminal

90 mm

Dip device in eutectic solder at 230 ± 5ºC

for 5.0 ± 0.5 seconds

≤ ±7.5%

Meets Initial Values (As Above)

Meets Initial Values (As Above)

Dip device in eutectic solder at 260ºC for 60

seconds. Store at room temperature for 24 ± 2

hours before measuring electrical properties.

Meets Initial Values (As Above)

No visual defects

≤ ±7.5%

Step 1: -55ºC ± 2º

Step 2: Room Temp

30 ± 3 minutes

≤ 3 minutes

Meets Initial Values (As Above)

Meets Initial Values (As Above)

Meets Initial Values (As Above)

No visual defects

≤ ±12.5%

≤ Initial Value x 2.0 (See Above)

≥ Initial Value x 0.3 (See Above)

Meets Initial Values (As Above)

No visual defects

≤ ±12.5%

≤ Initial Value x 2.0 (See Above)

≥ Initial Value x 0.3 (See Above)

Meets Initial Values (As Above)

Step 3: +125ºC ± 2º 30 ± 3 minutes

Step 4: Room Temp ≤ 3 minutes

Repeat for 5 cycles and measure after

24 ± 2 hours at room temperature

Charge device with 1.5 rated voltage (≤ 10V) in

test chamber set at 125ºC ± 2ºC

for 1000 hours (+48, -0)

Remove from test chamber and stabilize

at room temperature for 24 ± 2 hours

before measuring.

Store in a test chamber set at 85ºC ± 2ºC/

85% ± 5% relative humidity for 1000 hours

(+48, -0) with rated voltage applied.

Remove from chamber and stabilize at

room temperature and humidity for

24 ± 2 hours before measuring.

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