AD5520
AD5520 is Per Pin Parametric Measurement Unit/Source Measure Unit manufactured by Analog Devices.
FEATURES
Force/Measure Functions Force Voltage/Current, Measure Current/Voltage Force Current/Voltage, Measure Current/Voltage Force/Measure Voltage Range ؎11 V 4 Programmable Force/Measure Current Ranges ؎4 A, ؎40 A, ؎ 400 A, ؎4 m A Extended Current Ranges ؎40 m A and ؎ 160 m A with External Driver Clamp Circuitry and Window parators On Board Guard Amplifier 64-Lead LQFP Package APPLICATIONS Automatic Test Equipment Per Pin PMU, Shared Pin PMU, Device Power Supply Instrumentation Source Measure, Parametric Measurement, Precision Measurement GENERAL DESCRIPTION
The AD5520 is a single channel per pin parametric measurement unit (PPMU) for use in semiconductor automatic test equipment. The part is also suited for use as a source measurement unit for instrumentation applications. It contains programmable modes to force a pin voltage and measure the corresponding current or force a current and measure the voltage. The AD5520 can force/measure over a ± 11 V range or currents up to ± 4 m A with its on-board force amplifier. An external amplifier is required for wider current ranges. The device provides a force sense capability to ensure accuracy at the tester pin. A guard output is also available to drive the shield of a force/sense pair. The AD5520 is available in a 64-lead LQFP package.
FUNCTIONAL BLOCK DIAGRAM
POUT0 POUT1 POUT2 PIN0 PIN1 PIN2
AVEE AVCC
FOH FOH3 FOH2 FOH1 FOH0 MEASI5H
BW SELECT
CLAMP DETECT CLH CLL REFGND MEASIOUT G = 16 ISENSE INST AMP VSENSE INST AMP G=1
MEASI4H MEASI3H MEASI2H MEASI1H MEASI0H
MEASIL GUARDIN G=1 GUARD MEASVH MEASVL AGND
CLHDETECT CLLDETECT
MEASOUT
MEASVOUT PARATOR CPH CPOH CPOH CPL
LOGICS
STANDBY
QM5 QM4
AC0 AC1 DGND CS DVDD
CPSEL
MSEL
FSEL
AM2
AM1
CPCK
REV. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from...