ADATE324 Datasheet | Analog Devices

FEATURES GENERAL DESCRIPTION - 2 selectable data rates up to 1.6 GHz or 3.2 Gbps maximum toggle rate - DCL disable mode (low leakage typically <10 n A) - Power and speed programmable (driver and parators active) - 1.025 W power dissipation per channel low speed (Case A) - 1.125 W power dissipation per channel high speed (Case B) - Voltage driver - 3-level driver with high-Z and reflection clamps - Voltage range: - 1.5 V to +4.5 V (+5 V extended range) - Precision trimmed output resistance - Functional amplitude (VIH - VIL): 0.05 V minimum to 6.0 V maximum - 312.5 ps minimum pulse width (1.0 V programmed swing) - 26 ps deterministic jitter and 1.4 ps random jitter - parator - Differential and single-ended window modes - Input voltage range: - 1.5 V to +4.5 V (+5 V extended range) - 130 ps ERT/EFT normal window parator 1.0 V, terminated - Active load: ±12 m A current range - VHH drive - Dedicated VHH output pin - Voltage range: 0.0 V to 13.5 V - DC levels - Fully integrated and dedicated 16-bit DACs - On-chip gain and offset calibration registers with automatic add and multiply functions - Package: 9 mm × 9 mm, 121-ball chip scale package ball grid array [CSP_BGA] APPLICATIONS - ATE - Semiconductor and board test systems - Instrumentation and characterization equipment The ADATE324 is a plete, single-chip, quad-channel automatic test equipment (ATE) solution that performs the pin electronics (PE) functions of a driver, a parator, and an active load (DCL). The device also features a high voltage (VHH) drive capability per chip to support flash memory testing applications. Dedicated 16-bit digital-to-analog converters (DACs) with on-chip calibration registers provide all the necessary dc levels for operation of the device. The voltage driver features three active states: high, low, and terminate mode, as well as a high impedance inhibit state. The inhibit state, in conjunction with the integrated dynamic clamps, facilitates significant attenuation of transmission line...