SBAS263A − NOVEMBER 2003 − REVISED DECEMBER 2005
16ĆBit, Quad Voltage Output
D Low Glitch: 1nV-s (typ)
D Low Power: 18mW
D Unipolar or Bipolar Operation
D Settling Time: 12µs to 0.003%
D 16-Bit Linearity and Monotonicity:
–40°C to +85°C
D Programmable Reset to Mid-Scale or
D Double-Buffered Data Inputs
D Internal Bandgap Voltage Reference
D Power-On Reset
D 3V to 5V Logic Interface
The DAC7654 is a 16-bit, quad voltage output,
digital-to-analog converter (DAC) with 16-bit monotonic
performance over the specified temperature range. It
accepts 24-bit serial input data, has double-buffered DAC
input logic (allowing simultaneous update of all DACs),
and provides a serial data output for daisy-chaining
multiple DACs. Programmable asynchronous reset clears
all registers to a mid-scale code of 8000h or to a zero-scale
of 0000h. The DAC7654 can operate from a single +5V
supply or from +5V and –5V supplies.
Low power and small size per DAC make the DAC7654
ideal for automatic test equipment, DAC-per-pin
programmers, data acquisition systems, and closed-loop
servo-control. The DAC7654 is available in an LQFP
package and is specified for operation over the –40°C to
+85°C temperature range.
D Process Control
D Closed-Loop Servo-Control
D Motor Control
D Data Acquisition Systems
D DAC-per-Pin Programmers
D AC 76 54
IO V D D
VREFH A and B
VREFL A and B
VOUTA Sense 2
VOUTA Sense 1
VOUTB Sense 2
VOUTB Sense 1
VOUTC Sense 2
VOUTC Sense 1
VOUTD Sense 2
VOUTD Sense 1
VREFL C and D
VREFH C and D
This device has ESD-CDM sensitivity and special handling precautions must be taken.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Products
conform to specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all parameters.
Copyright 2003 − 2005, Texas Instruments Incorporated