512 M egabytes of memor y Dual channel testing environment
275MHz Canter wo od based test setup
Tested and p ac k aged in p air s
Packaged together immediately following system test
T E S T S P E C I F I C AT I O N S
Tested at aggressive latenc y settings of 2.5-4-4-8 on both Intel and AMD p latforms Te st volta ge: 2 . 7 5 V
B e n c h m a r k e d u s i n g b o t h At h l o n a n d Pe ntium test platforms Integrated aluminum heat spreader fo r i m p rove d t h e r m a l p e r fo r m a n ce Li.
