PMB
Metallized polypropylene film capacitor
MKP - Snubber capacitor
Main applications: Snubber, energy conversion and
control in power semiconductor circuits, IGBT modules
protection and SMPS protection circuits, high voltage,
high current and high pulse applications
Dielectric
Electrodes
Coating
Construction
Leads
Degree of protection
Installation
Reference standard
Climatic category
Operating temperature range(case)
Max. permissible ambient temperature
Rated capacitance (Cr)
Capacitance tolerance (at 1kHz)
Capacitance temperature coefficient
Long term stability (at 1kHz)
Rated voltage (Ur)
Non Recurrent Surge Voltage (Upk)
Self inductance
Maximum pulse rise time
Maximum peak current (Ipeak)
Dissipation factor (DF), max.
Polypropylene
Vacuum deposited metal layers
Solvent resistant plastic case with resin sealing. Flame retardant execution (UL 94 V-0)
Extended double side metallized carrier film with internal series connection and metallized
film (refer to general technical information)
Tinned copper lugs for screw fixing or soldering on PCBs (please refer to article table)
IP00
Whatever position assuring correct heat dissipation. Arrangement of many components
with box walls in contact not admitted; suggested minimum distance between side by
side elements ≥ 1/8 of the box thickness.
IEC 61071, IEC 60068
40/85/56 (IEC 60068/1), GPD (DIN40040)
-40°...+85°C
+70°C (operation at rated power, rated current and natural cooling)
0,047µF to 5,6µF. Refer to article table
±10% (code=K), ±5% (code=J) and ±20% (code=M). Other tolerances upon request
Refer to graphs in general technical information
Capacitance variation≤ ±1% after a period of 2 years at standard environmental
conditions
700, 850, 1000, 1200, 1500, 2000, 2500, 3000 Vdc
1000, 1200, 1400, 1600, 2000, 2400, 3000, 3500 Vdc
≤ 1nH/mm of fixing pitch
Refer to article table
Refer to article table. Max. non repetitive Ipk = 1,5 x Ipeak
(tgδ x10-4, measured at 25±5°C)
Freq.
1kHz
Cr ≤ 1,0µF
4
Cr> 1,0µF
6
Insulation resistance (IR)
Test voltage between terminals (Ut)
Test voltage between terminals and case
(Utc)
Damp heat test (steady state)
Typical capacitance change versus
operating time
Life expectancy
Failure quota
30000s but need not exceed 30GΩ (typical value), after 1 minute of electrification at
100Vdc (25 ± 5°C).
2xUr (DC) applied for 10s at 25±5°C (1 minute for type test)
3kV 50÷60Hz applied for 60s at 25±5°C
Test conditions:
Temperature= +40±2°C
Relative humidity= 93±2%
Test Duration= 56 days
Performance:
Capacitance change≤ ±2%
DF change≤ 0,0010 at 1kHz
IR≥ 50% of initial limit value
-3% after 30’000 hours at Urms or after 100’000 hours at Ur
≥ 30’000 hours
300/109 component hours
Ed.00 Rev.00
22.1
01.2000
