Datasheet Details
| Part number | SCAN18540T |
|---|---|
| Manufacturer | Fairchild (now onsemi) |
| File Size | 95.70 KB |
| Description | Inverting Line Driver |
| Datasheet |
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| Part number | SCAN18540T |
|---|---|
| Manufacturer | Fairchild (now onsemi) |
| File Size | 95.70 KB |
| Description | Inverting Line Driver |
| Datasheet |
|
|
|
|
The SCAN18540T is a high speed, low-power line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented paired output enable control signals.
This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).
SCAN18540T Inverting Line Driver with 3-STATE Outputs October 1991 Revised May 2000 SCAN18540T Inverting Line Driver with 3-STATE.
| Brand Logo | Part Number | Description | Manufacturer |
|---|---|---|---|
| SCAN18540T | Inverting Line Driver | National Semiconductor |
| Part Number | Description |
|---|---|
| SCAN182245A | Non-Inverting Transceiver |
| SCAN18245T | Non-Inverting Transceiver |
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