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IDT74AHCT244 Datasheet

High Speed CMOS Octal Buffer/Line Driver

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FEATURES:
• Equivalent to ALS speeds and output drive over full
temperature and voltage supply extremes
• 7ns typical data to output delay
• IOL = 14mA over full military temperature range
• CMOS power levels (5/LW typo static)
• Both CMOS and TTL output compatible
• Substantially lower input current levels than ALS (5/LA max.)
• Octal buffer/line driver with 3-state output
• 100% product assurance screening to MIL-STD-883, Class B
is available
• JEDEC standard pinout for DIP and LCC
DESCRIPTION:
The IDT54174AHCT244 are octal buffer/line drivers built using
advanced CEMOS'·, a dual metal CMOS technology. The
devices are designed to be employed as memory and address
drivers, clock drivers and bus-oriented transmitters/receivers
which provide improved board density.
PIN CONFIGURATIONS
ilEA
DA.
DB.
DA,
DB,
DA,
DB,
DA,
DB,
GND
Vee
OEB
OA.
DB.
OA,
DB,
OA,
DB,
DA,
DB,
SSD54fl4AHCT244-001
DIP
TOP VIEW
OB3
GND
LJ LJ L J L J LJ
::::9 8 7 6 5 43::
::10 2:::
OBo
DAo
O~3 ::::12
20:::
DB2 ::1~4 15 16 17 1~9::
, r1 r1 n rl r1 /
Vee
DEB
SSD54/74AHCT244-002
Lee
TOP VIEW
FUNCTIONAL BLOCK DIAGRAM
OEA
DA. OEB
DB. OA.
DA, DB.
DB, OA,
DA, DB,
DB, OA,
DA, DB,
DB, OA,
DB,
SS054/74AHGT244-0oc,
CEMOS is a trademark of Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
tel 1986 Integrated Device Technology, Inc.
5-47
JULY 1986
Printed in U.S.A.


Integrated Device Technology Electronic Components Datasheet

IDT74AHCT244 Datasheet

High Speed CMOS Octal Buffer/Line Driver

No Preview Available !

IDT54/74AHCT244 HIGH-SPEED CMOS OCTAL BUFFER/LINE DRIVER
ABSOLUTE MAXIMUM RATING(1)
SYMBOL
RATING
COMMERCIAL MILITARY UNIT
VTERM
Terminal Voltage
with Respect
toGND
-0.5 to +7.0 -0.5 to +7.0 V
TA
Operating
Temperature
o to +70
-55 to +125 °C
TBIAS
Temperature
Under Bias
-55 to +125 -65 to +135 °C
TSTG
Storage
Temperature
-55 to +125 -65 to +155 °C
lOUT
DC Output Current
120
120 mA
NOTE:
I.Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those
indicated in the operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions for extended periods may
affect reliability.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
TA = O°C to +70°C
Vee = 5.0V ± 5%
Min. = 4.75V
TA = -55°C to +125°C
Vee = 5.0V ± 10%
Min. = 4.50V
Max. = 5.25V (Commercial)
Max. = 5.50V (Military)
VLe = 0.2V
VHe = Vee - 0.2V
SYMBOL
V,H
V'L
I'H
I'L
Ise
PARAMETER
Input HIGH Level
Input LOW Level
Input HIGH Current
Input LOW Current
Short Circuit Current
VOH Output HIGH Voltage
VOL Output LOW Voltage
TEST CONDITIONS(')
Guaranteed Logic High Level
Guaranteed Logic Low Level
Vec =Max.• Y,N =Vee
Vee =Max., V,N = GND
=Vee Max. (31
Vee =3V, V,N = VLe or VHe, 10H = -32"A
Vee =Min.
Y,N = V,H or V'L
10H =-150"A
10H =-12mA MIL
10H =-15mA COM
Vee =3V, V,N = VLe or VHe, 10L = 300"A
Vee =Min.
=V,N V,H or V,L
10L =300"A
10L =14mA MIL
10L =24mA COM
MIN.
2.0
-
-
-
-60
VHe
VHe
2.4
2.4
-
-
-
-
TYP.(')
-
-
-
-
-100
Vee
Vee
4.3
4.3
GND
GND
-
-
NOTES:
1. For conditions shown as max. or min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vee = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
MAX.
-
0.8
5
-5
-
-
-
-
-
VLe
VLe
0.4
0.5
UNIT
V
V
"A
"A
mA
V
V
5-48


Part Number IDT74AHCT244
Description High Speed CMOS Octal Buffer/Line Driver
Maker IDT
Total Page 3 Pages
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