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Integrated Device Technology Electronic Components Datasheet

IDT74FCT182 Datasheet

Fast CMOS Carry Lookahead Generator

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FEATURES:
• IDT54/74FCT182 equivalent to FASr" specs
IDT54!74FCT182A 35% laster than FAST
• Equivalent to FASr" speeds and output drive over lull
temperature and voltage supply extremes
• IOL = 32mA over full military temperature range
• CMOS power levels (5p.W typo static)
• Both CMOS and TTL output compatible
• Substantially lower input current levels than FASr"
(5p.A max.)
• Carry lookahead generator
• 100% product assurance screening to MIL-STD-883, Class B
is avai lable
• JEDEC standard pinout for DIP and LCC
DESCRIPTION:
The IDT54/74FCT182 and IDT54174FCT182A are high-speed
carry lookahead generators built using advanced CEMOS'", a
dual metal CMOS technology. The IDT54174FCT182 and IDT541
74FCT182A are generally used with a 4-bit arithmetic logic unitto
provide high-speed lookahead over word lengths of more than
four bits.
PIN CONFIGURATIONS
G,
P,
Go
Po
G3
P3
P
GND
Vee
P2
G2
Cn
Cn+x
Cn +y
G
Cn+l
SSDFCT182-001
DIP/SOIC
TOP VIEW
FUNCTIONAL BLOCK DIAGRAM
0('I') (I')
00
Ia.. 10 Z Ia.. 10
P
GND
NC
Cn+z
G
':::L J L J LJ LJ L J
:9 8 7
54
:10
2~
~11 1:::::=
,.~12
~1:;4 15
20:
1:1:::::
17 18
r1 n r1 r1 rl
P,
G,
NC
Vee
P2
~
C
i": 0Z
eN
010
00
SSDFCT182-0Q2
LCC
TOP VIEW
CEMOS is a trademark of Integrated Device Technology, Inc.
FAST is a trademark of Fairchild Semiconductor Co.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
~ 1986 Integrated Oevice Technology. Inc
5-109
SSDFCT182-003
JULY 1986
Printed In the U.S.A.


Integrated Device Technology Electronic Components Datasheet

IDT74FCT182 Datasheet

Fast CMOS Carry Lookahead Generator

No Preview Available !

IDT54/74FCT1821A
FAST CMOS CARRY LOOKAHEAD GENERATOR
ABSOLUTE MAXIMUM RATING(1)
SYMBOL
RATING
COMMERCIAL MILITARY UNIT
VTERM
Terminal Voltage
with Respect
toGND
-0.5 to +7.0 -0.5 to +7.0 V
TA
Operating
Temperature
oto +70
-55 to +125 ·C
TBIAS
Temperature
Under Bias
-55 to +125 -65 to +135 ·C
TSTG
Storage
Temperature
-55 to +125 -65 to +155 ·C
lOUT DC Output Current
120
120 mA
NOTE:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above
those indicated in the operational sections ofthls specification Is not Implied.
Exposure to absolute maximum rating conditions for extended periods may
affect reliability.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
=TA O·C to +70·C
=Vee 5.0V ± 5%
=Min. 4.75V
=TA -55·C to +125·C
=Vee 5.0V ± 10%
=Min. 4.50V
Max. = 5.25V (Commercial)
Max. = 5.50V (Military)
VLe = 0.2V
VHe = Vee - 0.2V
SYMBOL
V,H
V,L
IIH
IlL
Ise
VOH
PARAMETER
Input HIGH Level
Input LOW Level
Input HIGH Current
Input lOW Current
Short Circuit Cucrent
Output HIGH Voltage
VOL Output LOW Voltage
TEST CONDITIONS(1)
Guaranteed Logic High level
Guaranteed Logic Low Level
Vee =Max., Y,N =Vee
Vee =Max., Y'N =GND
=Vee Max. (3)
Vee =3V, VIN =VLe or VHe, 10H =-32"A
Vee =Min.
Y,N =VIH or VIL
10H =-300"A
10H =-12mA MIL.
10H =-15mA COM'l.
Vee =3V, Y'N =VLe or VHe, 10L =300"A
Vee =Min.
VIN =V,H or VIL
10L =300"A
10L =32mA MIL.
10L =48mA COM'L.
MIN.
2.0
-
-
-
-60
VHe
VHe
2.4
2.4
-
-
-
-
TYP'(2)
-
-
-
-
-120
Vee
Vee
4.3
4.3
GND
GND
0.3
0.3
NOTE8:
1. For conditions shown as max. or min., use appropriate value speeifled under Electrical Characteristics for the applicable device type.
=2. Typical values are at Vee 5.0V. +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
MAX.
-
0.8
5
-5
-
-
-
-
-
VLe
VLe
0.5
0.5
UNIT
V
V
"A
"A
mA
V
V
5-110


Part Number IDT74FCT182
Description Fast CMOS Carry Lookahead Generator
Maker IDT
Total Page 4 Pages
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