S25HL04GT
Key Features
- Functional Safety with the Industry’s first ISO26262 ASIL B pliant and ASIL D ready NOR flash
- EnduraFlex™ Architecture provides High-Endurance and Long Retention Partitions
- Data Integrity CRC detects errors in memory array
- SafeBoot reports device initialization failures, detects configuration corruption and provides recovery options
- Built-in Error Correcting Code (ECC) corrects Single-bit Error and detects Double-bit Error (SECDED) on memory array data
- Sector Erase Status indicator for power loss during erase - Protection features
- Legacy Block Protection for memory array and device configuration
- Data Integrity - 02GT DDP, 04GT QDP devices
- Minimum 2,560,000 Program-Erase cycles for the Main array - All devices
- Minimum 300,000 Program-Erase cycles for the 4 KB Sectors
