Download the IS-1009EH datasheet PDF.
This datasheet also covers the IS-1009RH variant, as both devices belong to the same radiation hardened 2.5v reference family and are provided as variant models within a single manufacturer datasheet.
General Description
PKG.
DWG.# TYPE TEMP.
Key Features
Electrically screened to SMD #5962-00523.
QML qualified per MIL-PRF-38535 requirements.
EH version acceptance tested to 50krad(Si) (LDR).
Radiation environment - IS-1009EH
- High dose rate (50-300rad(Si)/s).
. 300 krad(Si) - Low dose rate (0.01rad(Si)/s).
. . . . 50krad(Si).
Radiation environment - IS-1009RH - High dose rate (50-300rad(Si)/s).
Note: The manufacturer provides a single datasheet file (IS-1009RH_IntersilCorporation.pdf) that lists specifications for multiple related part numbers.
Full PDF Text Transcription for IS-1009EH (Reference)
Note: Below is a high-fidelity text extraction (approx. 800 characters) for
IS-1009EH. For precise diagrams, and layout, please refer to the original PDF.
IS-1009RH, IS-1009EH Radiation Hardened 2.5V Reference The Radiation Hardened IS-1009RH, IS-1009EH are a 2.5V shunt regulator diode is designed to provide a stable 2.5V r...
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re a 2.5V shunt regulator diode is designed to provide a stable 2.5V reference over a wide current range. These devices are designed to maintain stability over the full military temperature range and over time. The 0.2% reference tolerance is achieved by on-chip trimming. An adjustment terminal is provided to allow for the calibration of system errors. The use of this terminal to adjust the reference voltage does not effect the temperature coefficient. Constructed with the dielectrically isolated EBHF process, these devices are immune to single event latch-up and have been specifically designed to provide highly reliable p
IS-1009EH Datasheet
