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ISL22326WM - Dual Digitally Controlled Potentiometers

Overview

DATASHEET ISL22326WM Dual Digitally Controlled Potentiometers (XDCP™) Low Noise, Low Power, I2C Bus, 128 Taps FN6623 Rev 1.00 November 11, 2011 The ISL22326WMVEP integrates two digitally controlled potentiometers (XDCP) and non-volatile memory on a monolithic CMOS integrated circuit.

The digitally controlled potentiometers are implemented with a combination of resistor elements and CMOS switches.

The position of the wipers are controlled by the user through the I2C bus interface.

Key Features

  • Specifications per DLA VID V62/08604-01XE.
  • Full Mil-Temp Electrical Performance from -55°C to +125°C.
  • Controlled Baseline with One Wafer Fabrication Site and One Assembly/Test Site.
  • Full Homogeneous Lot Processing in Wafer Fab.
  • No Combination of Wafer Fabrication Lots in Assembly.
  • Full Traceability Through Assembly and Test by Date/Trace Code Assignment.
  • Enhanced Process Change Notification.
  • Enhanced Obsolescence Management.