ISL22326WM Description
DATASHEET ISL22326WM Dual Digitally Controlled Potentiometers (XDCP™) Low Noise, Low Power, I2C Bus, 128 Taps FN6623 Rev 1.00 November 11, 2011 The ISL22326WMVEP integrates two digitally controlled potentiometers (XDCP) and non-volatile memory on a monolithic CMOS integrated circuit. The digitally controlled potentiometers are implemented with a bination of resistor elements and CMOS switches. The position of the...
ISL22326WM Key Features
- Specifications per DLA VID V62/08604-01XE
- Full Mil-Temp Electrical Performance from -55°C to +125°C
- Controlled Baseline with One Wafer Fabrication Site and One Assembly/Test Site
- Full Homogeneous Lot Processing in Wafer Fab
- No bination of Wafer Fabrication Lots in Assembly
- Full Traceability Through Assembly and Test by Date/Trace Code Assignment
- Enhanced Process Change Notification
- Enhanced Obsolescence Management
- Eliminates Need for Up-Screening a COTS ponent
- Two Potentiometers in One Package
ISL22326WM Applications
- Specifications per DLA VID V62/08604-01XE