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CD4029BMS Datasheet

CMOS Presettable Up/Down Counter

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CD4029BMS
December 1992
CMOS Presettable Up/Down Counter
Features
• High-Voltage Type (20V Rating)
• Medium Speed Operation: 8MHz (Typ.) at CL = 50pF
and VDD - VSS = 10V
• Multi-Package Parallel Clocking for Synchronous High
Speed Output Response or Ripple Clocking for Slow
Clock Input Rise and Fall Times
• “Preset Enable” and Individual “Jam” Inputs Provided
• Binary or Decade Up/Down Counting
• BCD Outputs in Decade Mode
• 100% Tested for Maximum Quiescent Current at 20V
• 5V, 10V and 15V Parametric Ratings
• Standardized Symmetrical Output Characteristics
• Maximum Input Current of 1µA at 18V Over Full Pack-
age-Temperature Range; 100nA at 18V and +25oC
• Noise Margin (Over Full Package Temperature Range):
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
• Meets All Requirements of JEDEC Tentative Stan-
dards No. 13B, “Standard Specifications for Descrip-
tion of “B” Series CMOS Device’s
Applications
• Programmable Binary and Decade Counting/Fre-
quency Synthesizers-BCD Output
• Analog to Digital and Digital to Analog Conversion
• Up/Down Binary Counting
• Difference Counting
• Magnitude and Sign Generation
• Up/Down Decade Counting
Description
CD4029BMS consists of a four-stage binary or BCD-decade up/
down counter with provisions for look-ahead carry in both count-
ing modes. The inputs consist of a single CLOCK, CARRY-IN
(CLOCK ENABLE), BINARY/DECADE, UP/DOWN, PRESET
ENABLE, and four individual JAM signals. Q1, Q2, Q3, Q4 and a
CARRY OUT signal are provided as outputs.
A high PRESET ENABLE signal allows information on the JAM
INPUTS to preset the counter to any state asynchronously with
the clock. A low on each JAM line, when the PRESET-ENABLE
signal is high, resets the counter to its zero count. The counter is
advanced one count at the positive transition of the clock when
the CARRY-IN and PRE-SET ENABLE signals are low.
Advancement is inhibited when the CARRY-IN or PRESET
ENABLE signals are high. The CARRY-OUT signal is normally
high and goes low when the counter reaches its maximum count
in the UP mode or the minimum count in the DOWN mode pro-
vided the CARRY-IN signal is low. The CARRY-IN signal in the
low state can thus be considered a CLOCK ENABLE. The
CARRY-IN terminal must be connected to VSS when not in use.
Binary counting is accomplished when the BINARY/DECADE
input is high; the counter counts in the decade mode when the
BINARY/DECADE input is low. The counter counts up when the
UP/DOWN input is high, and down when the UP/DOWN input is
low. Multiple packages can be connected in either a parallel-
clocking or a ripple-clocking arrangement as shown in Figure 17.
Parallel clocking provides synchronous control and hence faster
response from all counting outputs. Ripple-clocking allows for
longer clock input rise and fall times.
The CD4029BMS is supplied in these 16-lead outline packages:
Braze Seal DIP H4X
Frit Seal DIP
H1F
Ceramic Flatpack H6W
Pinout
CD4029BMS
TOP VIEW
PRESET ENABLE 1
Q4 2
JAM 4 3
JAM 1 4
CARRY IN 5
Q1 6
CARRY OUT 7
VSS 8
16 VDD
15 CLOCK
14 Q3
13 JAM 3
12 JAM 2
11 Q2
10 UP/DOWN
9 BINARY/DECADE
Functional Diagram
PRESET
ENABLE
CARRY IN
(CLOCK
1
ENABLE) 5
JAM INPUTS
1 2 3 4 VDD
4 12 13 3
16
6 Q1
BINARY/
DECADE 9
UP/DOWN 10
CLOCK 15
11 Q2
Q3
14
BUFFERED
OUTPUTS
Q4
2
7
8
VSS
CARRY
OUT
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
7-798
File Number 3304


Intersil Electronic Components Datasheet

CD4029BMS Datasheet

CMOS Presettable Up/Down Counter

No Preview Available !

Specifications CD4029BMS
Absolute Maximum Ratings
DC Supply Voltage Range, (VDD) . . . . . . . . . . . . . . . -0.5V to +20V
(Voltage Referenced to VSS Terminals)
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VDD +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA
Operating Temperature Range . . . . . . . . . . . . . . . . -55oC to +125oC
Package Types D, F, K, H
Storage Temperature Range (TSTG) . . . . . . . . . . . -65oC to +150oC
Lead Temperature (During Soldering) . . . . . . . . . . . . . . . . . +265oC
At Distance 1/16 ± 1/32 Inch (1.59mm ± 0.79mm) from case for
10s Maximum
Reliability Information
Thermal Resistance . . . . . . . . . . . . . . . .
θja
Ceramic DIP and FRIT Package . . . . . 80oC/W
θjc
20oC/W
Flatpack Package . . . . . . . . . . . . . . . . 70oC/W
20oC/W
Maximum Package Power Dissipation (PD) at +125oC
For TA = -55oC to +100oC (Package Type D, F, K) . . . . . . 500mW
For TA = +100oC to +125oC (Package Type D, F, K) . . . . . Derate
Linearity at 12mW/oC to 200mW
Device Dissipation per Output Transistor . . . . . . . . . . . . . . . 100mW
For TA = Full Package Temperature Range (All Package Types)
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS (NOTE 1)
GROUP A
SUBGROUPS TEMPERATURE
LIMITS
MIN MAX UNITS
Supply Current
IDD VDD = 20V, VIN = VDD or GND
1
+25oC
- 10 µA
2
+125oC
- 1000 µA
VDD = 18V, VIN = VDD or GND
3
-55oC
- 10 µA
Input Leakage Current
IIL VIN = VDD or GND VDD = 20
1
+25oC
-100
-
nA
2
+125oC
-1000 -
nA
VDD = 18V
3
-55oC
-100
-
nA
Input Leakage Current
IIH VIN = VDD or GND VDD = 20
1
+25oC
- 100 nA
2
+125oC
- 1000 nA
VDD = 18V
3
-55oC
- 100 nA
Output Voltage
VOL15 VDD = 15V, No Load
1, 2, 3
+25oC, +125oC, -55oC -
50 mV
Output Voltage
VOH15 VDD = 15V, No Load (Note 3)
1, 2, 3
+25oC, +125oC, -55oC 14.95
-
V
Output Current (Sink)
IOL5 VDD = 5V, VOUT = 0.4V
1
+25oC
0.53 - mA
Output Current (Sink)
IOL10 VDD = 10V, VOUT = 0.5V
1
+25oC
1.4 - mA
Output Current (Sink)
IOL15 VDD = 15V, VOUT = 1.5V
1
+25oC
3.5 - mA
Output Current (Source) IOH5A VDD = 5V, VOUT = 4.6V
1
+25oC
- -0.53 mA
Output Current (Source) IOH5B VDD = 5V, VOUT = 2.5V
1
+25oC
- -1.8 mA
Output Current (Source) IOH10 VDD = 10V, VOUT = 9.5V
1
+25oC
- -1.4 mA
Output Current (Source) IOH15 VDD = 15V, VOUT = 13.5V
1
+25oC
- -3.5 mA
N Threshold Voltage
VNTH VDD = 10V, ISS = -10µA
1
+25oC
-2.8 -0.7 V
P Threshold Voltage
VPTH VSS = 0V, IDD = 10µA
1
+25oC
0.7 2.8
V
Functional
F VDD = 2.8V, VIN = VDD or GND
VDD = 20V, VIN = VDD or GND
7
7
+25oC
+25oC
VOH > VOL < V
VDD/2 VDD/2
VDD = 18V, VIN = VDD or GND
8A
+125oC
VDD = 3V, VIN = VDD or GND
8B
-55oC
Input Voltage Low
(Note 2)
VIL VDD = 5V, VOH > 4.5V, VOL < 0.5V 1, 2, 3 +25oC, +125oC, -55oC -
1.5 V
Input Voltage High
(Note 2)
VIH VDD = 5V, VOH > 4.5V, VOL < 0.5V 1, 2, 3 +25oC, +125oC, -55oC 3.5
-
V
Input Voltage Low
(Note 2)
VIL VDD = 15V, VOH > 13.5V,
VOL < 1.5V
1, 2, 3
+25oC, +125oC, -55oC -
4V
Input Voltage High
(Note 2)
VIH VDD = 15V, VOH > 13.5V,
VOL < 1.5V
1, 2, 3
+25oC, +125oC, -55oC 11
-
V
NOTES: 1. All voltages referenced to device GND, 100% testing being 3. For accuracy, voltage is measured differentially to VDD. Limit
implemented.
is 0.050V max.
2. Go/No Go test with limits applied to inputs.
7-799


Part Number CD4029BMS
Description CMOS Presettable Up/Down Counter
Maker Intersil Corporation
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CD4029BMS Datasheet PDF






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