NT2H2331S0 Datasheet | NXP Semiconductors

feature Rev. 3.1 - 5 April 2023 Product data sheet 1 General description NTAG 223 DNA Status Detect (in the data sheet short NTAG 223 DNA SD) is an innovative single-chip solution offering security, tamper detection and sensing, bined with cost-efficiency. The technology uses multilayered protection to support a broad range of NFC-based applications that can be trusted to protect products, services, and Io T-driven user experiences at scale. NTAG 223 DNA SD is an NFC Type 2 Tag pliant security IC with a 144 byte user memory, offering a new Status Detect functionality to enable a broad range of passively powered, status-aware NFC applications. The IC uses AES-128 cryptography and is mon Criteria EAL3+ (AVA.VAN.2) certified. The NTAG 223 DNA SD IC adds flexibility by offering two tamper evident modes: conductance or capacitance. There is no need for a dedicated app. Conductive tamper detection uses a connected tamper loop that, when broken, irreversibly writes the onceopen status into the IC memory upon IC start-up. It sends the open status to the cloud as part of the Secure Unique NFC (SUN) message - upon readout with an NFC-enabled device such as a cell phone. With capacitive tamper detection, the NTAG 223 DNA Status Detect IC needs to be connected to a sensing capacitor. Upon readout, the IC measures the capacitance and pares it to pre-configured limits. When these limits are exceeded, the open status s added to the SUN message. Capacitive tamper detection is well suited for integration into physical form factors, and it’s also harder for fraudsters to reconstruct. Alternatively, the NTAG 223 DNA SD IC can be used as a simple passive sensing device to detect a change in a specific condition, such as humidity, liquid fill level or pressure. Changes in measured capacitor values are captured with an NFC reader, and are interpreted by a mobile or cloud-based application, e.g. if outside the predefined range. NTAG 223 DNA SD IC es with a Secure Unique NFC (SUN) message...