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SCAN182245A - Non-Inverting Transceiver

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Description

The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals This device is compliant with IEEE 1149 1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI) Test Data Out (TDO) Test Mode Select (TMS) and Test Clock (TCK)

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Other Datasheets by National Semiconductor
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