| Part number | SCAN18373T |
|---|---|
| Manufacturer | National Semiconductor (now Texas Instruments) |
| File Size | 170.88 KB |
| Description | Transparent Latch |
| Datasheet | SCAN18373T_NationalSemiconductor.pdf |
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The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals. This device is pliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).
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