SCAN18373T Overview
The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals. This device is pliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data...