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SCAN18374T Datasheet D Flip-Flop

Manufacturer: National Semiconductor (now Texas Instruments)

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General Description

The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals.

This device is compliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Overview

SCAN18374T D Flip-Flop with TRI-STATE Outputs September 1998 SCAN18374T D Flip-Flop with TRI-STATE ®.

Key Features

  • n n n n n n n n n n IEEE 1149.1 (JTAG) Compliant Buffered positive edge-triggered clock TRI-STATE outputs for bus-oriented.

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