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SCAN921226H Datasheet High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes

Manufacturer: National Semiconductor (now Texas Instruments)

Download the SCAN921226H datasheet PDF. This datasheet also includes the SCAN921025H variant, as both parts are published together in a single manufacturer document.

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Note: The manufacturer provides a single datasheet file (SCAN921025H_NationalSemiconductor.pdf) that lists specifications for multiple related part numbers.

General Description

The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock.

The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock.

Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test.

Overview

December 2005 www.DataSheet4U.com SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit BLVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.

Key Features

  • provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed. The SCAN921025H transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count,.

📁 Similar Datasheet

Brand Logo Part Number Description Manufacturer
Texas Instruments Logo SCAN921226H High Temperature 20-80 MHz 10-Bit Bus LVDS SerDes Texas Instruments
Texas Instruments Logo SCAN921226 30-80 MHz 10-Bit Bus LVDS Serializer and Deserializer Texas Instruments

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