Part SCANSTA111
Description Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port
Manufacturer National Semiconductor
Size 524.14 KB
National Semiconductor
SCANSTA111

Overview

The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.