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  ON Semiconductor Electronic Components Datasheet  

CAT24C128 Datasheet

128kb I2C CMOS Serial EEPROM

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CAT24C128 pdf
CAT24C128
128 kb I2C CMOS Serial
EEPROM
Description
The CAT24C128 is a 128 kb Serial CMOS EEPROM, internally
organized as 16,384 words of 8 bits each.
It features a 64byte page write buffer and supports both the
Standard (100 kHz), Fast (400 kHz) and FastPlus (1 MHz) I2C
protocol.
Write operations can be inhibited by taking the WP pin High (this
protects the entire memory).
OnChip ECC (Error Correction Code) makes the device suitable
for high reliability applications.*
Features
Supports Standard, Fast and FastPlus I2C Protocol
1.8 V to 5.5 V Supply Voltage Range
64Byte Page Write Buffer
Hardware Write Protection for Entire Memory
Schmitt Triggers and Noise Suppression Filters on I2C Bus Inputs
(SCL and SDA)
Low Power CMOS Technology
1,000,000 Program/Erase Cycles
100 Year Data Retention
Industrial and Extended Temperature Range
8lead PDIP, SOIC, TSSOP, MSOP and UDFN Packages
This Device is PbFree, Halogen Free/BFR Free and RoHS
Compliant**
VCC
SCL
A2, A1, A0
WP
CAT24C128
SDA
VSS
Figure 1. Functional Symbol
*Available for New Product (Rev. C)
** For additional information on our PbFree strategy and soldering details,
please download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
http://onsemi.com
PDIP8
L SUFFIX
CASE 646AA
UDFN8
HU4 SUFFIX
CASE 517AZ
TSSOP8
Y SUFFIX
CASE 948AL
SOIC8
W SUFFIX
CASE 751BD
MSOP8
Z SUFFIX
CASE 846AD
UDFN8***
HU3 SUFFIX
CASE 517AX
PIN CONFIGURATION
A0 1
A1
VCC
WP
A2 SCL
VSS SDA
PDIP (L), SOIC (W), TSSOP (Y), MSOP
(Z), UDFN (HU3***), UDFN (HU4)
For the location of Pin 1, please consult the
corresponding package drawing.
*** Not recommended for new design.
PIN FUNCTION
Pin Name
Function
A0, A1, A2
SDA
Device Address Inputs
Serial Data Input/Output
SCL Serial Clock Input
WP Write Protect Input
VCC Power Supply
VSS Ground
†The exposed pad for the TDFN/UDFN packages can
be left floating or connected to Ground.
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 16 of this data sheet.
© Semiconductor Components Industries, LLC, 2013
August, 2013 Rev. 15
1
Publication Order Number:
CAT24C128/D


  ON Semiconductor Electronic Components Datasheet  

CAT24C128 Datasheet

128kb I2C CMOS Serial EEPROM

No Preview Available !

CAT24C128 pdf
CAT24C128
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameter
Rating
Units
Storage Temperature
65 to +150
°C
Voltage on Any Pin with Respect to Ground (Note 1)
0.5 to +6.5
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The DC input voltage on any pin should not be lower than 0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than 1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol
Parameter
Min Units
NEND (Notes 3, 4) Endurance
1,000,000
Program / Erase Cycles
TDR Data Retention
100 Years
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100
and JEDEC test methods.
3. Page Mode, VCC = 5 V, 25°C
4. The new product revision (C) uses ECC (Error Correction Code) logic with 6 ECC bits to correct one bit error in 4 data bytes. Therefore, when
a single byte has to be written, 4 bytes (including the ECC bits) are reprogrammed. It is recommended to write by multiple of 4 bytes in order
to benefit from the maximum number of write cycles.
Table 3. D.C. OPERATING CHARACTERISTICS Mature Product (Rev B)
(VCC = 1.8 V to 5.5 V, TA = 40°C to +125°C, unless otherwise specified.)
Symbol
Parameter
Test Conditions
ICCR
ICCW
ISB
IL
VIL
VIH
VOL1
VOL2
Read Current
Write Current
Standby Current
I/O Pin Leakage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output Low Voltage
Read, fSCL = 400 kHz
Write, fSCL = 400 kHz
All I/O Pins at GND or VCC
TA = 40°C to +85°C
TA = 40°C to +125°C
Pin at GND or VCC
TA = 40°C to +85°C
TA = 40°C to +125°C
VCC 2.5 V, IOL = 3.0 mA
VCC < 2.5 V, IOL = 1.0 mA
Min
0.5
VCC x 0.7
Max
1
3
1
2
1
2
VCC x 0.3
VCC + 0.5
0.4
0.2
Units
mA
mA
mA
mA
V
V
V
V
Table 4. PIN IMPEDANCE CHARACTERISTICS Mature Product (Rev B)
(VCC = 1.8 V to 5.5 V, TA = 40°C to +125°C, unless otherwise specified.)
Symbol
Parameter
Conditions
Max Units
CIN (Note 5) SDA I/O Pin Capacitance
VIN = 0 V
8 pF
CIN (Note 5) Input Capacitance (other pins)
VIN = 0 V
6 pF
IWP (Note 6) WP Input Current
VIN < VIH
200 mA
VIN > VIH
1 mA
5. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100
and JEDEC test methods.
6. When not driven, the WP pin is pulled down to GND internally. For improved noise immunity, the internal pulldown is relatively strong;
therefore the external driver must be able to supply the pulldown current when attempting to drive the input HIGH. To conserve power, as
the input level exceeds the trip point of the CMOS input buffer (~ 0.5 x VCC), the strong pulldown reverts to a weak current source.
http://onsemi.com
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Part Number CAT24C128
Description 128kb I2C CMOS Serial EEPROM
Maker ON Semiconductor
Total Page 16 Pages
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