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KAF-1001 Datasheet

CCD IMAGE SENSOR

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KAF-1001
1024 (H) x 1024 (V) Full
Frame CCD Image Sensor
Description
The KAF−1001 Image Sensor is a high-performance
charge-coupled device (CCD) designed for a wide range of image
sensing applications.
The sensor incorporates true two-phase CCD technology,
simplifying the support circuits required to drive the sensor as well as
reducing dark current without compromising charge capacity.
The sensor also utilizes the TRUESENSE Transparent Gate Electrode
to improve sensitivity compared to the use of a standard front side
illuminated polysilicon electrode.
Selectable on-chip output amplifiers allow operation to be
optimized for different imaging needs: Low Noise (when using the
high-sensitivity output) or Maximum Dynamic Range (when using the
low-sensitivity output).
Table 1. GENERAL SPECIFICATIONS
Parameter
Typical Value
Architecture
Full Frame CCD
Pixel Count
1024 (H) × 1024 (V)
Pixel Size
24 mm (H) × 24 mm (V)
Active Image Size
24.6 mm (H) × 24.6 mm (V)
34.8 mm (Diagonal)
APS−H Optical Format
Chip Size
28.6 mm (H) × 25.5 mm (V)
Optical Fill-Factor
100%
Saturation Signal
High Sensitivity Output
High Dynamic Range
240,000 electrons
650,000 electrons
Output Sensitivity
High Sensitivity Output
High Dynamic Range
11 mV/electron
2 mV/electron
Readout Noise (1 MHz)
Dark Current
(25°C, Accumulation Mode)
15 electrons rms
< 30 pA/cm2
Dark Current Doubling Rate
5−6°C
Dynamic Range (Sat Sig/Dar Noise)
High Sensitivity Output
High Dynamic Range
83 dB
97 dB
Quantum Efficiency
(450, 550, 650 nm)
40%, 55%, 65%
Maximum Data Rate
High Sensitivity Output
High Dynamic Range
5 MHz
2 MHz
Transfer Efficiency (2 MHz, to −40°C) > 0.99997
Package
CERDIP Package (Sidebrazed)
Cover Glass
Clear
NOTE: Parameters above are specified at T = 25°C unless otherwise noted.
www.onsemi.com
Figure 1. KAF−1001 CCD Image Sensor
Features
True Two Phase Full Frame Architecture
TRUESENSE Transparent Gate Electrode
for High Sensitivity
100% Fill Factor
Low Dark Current
Single Readout Register
User-selectable Outputs Allow either Low
Noise or High Dynamic Range Operation
Applications
Scientific
Medical
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2015
December, 2015 − Rev. 2
1
Publication Order Number:
KAF−1001/D


  ON Semiconductor Electronic Components Datasheet  

KAF-1001 Datasheet

CCD IMAGE SENSOR

No Preview Available !

KAF−1001
ORDERING INFORMATION
Table 2. ORDERING INFORMATION − KAF−1001 IMAGE SENSOR
Part Number
Description
KAF−1001−AAA−CP−B1
Monochrome, No Microlens, CERDIP Package (Sidebrazed),
Taped Clear Cover Glass (No Coatings), Grade 1
KAF−1001−AAA−CP−B2
Monochrome, No Microlens, CERDIP Package (Sidebrazed),
Taped Clear Cover Glass (No Coatings), Grade 2
KAF−1001−AAA−CP−AE
Monochrome, No Microlens, CERDIP Package (Sidebrazed),
Taped Clear Cover Glass (No Coatings), Engineering Sample
KAF−1001−AAA−CB−AE
Monochrome, No Microlens, CERDIP Package (Sidebrazed),
Clear Cover Glass (No Coatings), Engineering Sample
KAF−1001−AAA−CB−B2
Monochrome, No Microlens, CERDIP Package (Sidebrazed),
Clear Cover Glass (No Coatings), Grade 2
Marking Code
KAF−1001−AAA
Serial Number
Table 3. ORDERING INFORMATION − EVALUATION SUPPORT
Part Number
KEK−4H0080−KAF−1001−12−5
Evaluation Board (Complete Kit)
Description
See the ON Semiconductor Device Nomenclature document (TND310/D) for a full description of the naming convention
used for image sensors. For reference documentation, including information on evaluation kits, please visit our web site at
www.onsemi.com.
www.onsemi.com
2


Part Number KAF-1001
Description CCD IMAGE SENSOR
Maker ON Semiconductor
Total Page 16 Pages
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