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  ON Semiconductor Electronic Components Datasheet  

NL17SG00 Datasheet

Single 2-Input NAND Gate

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NL17SG00
Single 2-Input NAND Gate
The NL17SG00 MiniGatet is an advanced high−speed CMOS
2−input NAND gate in ultra−small footprint.
The NL17SG00 input structures provides protection when voltages
up to 4.6 V are applied.
Features
Wide Operating VCC Range: 0.9 V to 3.6 V
High Speed: tPD = 2.5 ns (Typ) at VCC = 3.0 V, CL = 15 pF
Low Power Dissipation: ICC = 0.5 mA (Max) at TA = 25°C
4.6 V Overvoltage Tolerant (OVT) Input Pins
Ultra−Small Packages
These are Pb−Free and Halide−Free Devices
IN A 1
GND 2
5 VCC
IN A 1
IN B 2
6 VCC
5 NC
IN B 3
SOT−953
4 OUT Y
GND 3
4 OUT Y
UDFN6
http://onsemi.com
MARKING
DIAGRAMS
SOT−953
CASE 527AE
TM
1
UDFN6
1.0 x 1.0
CASE 517BX
M
1
UDFN6
1.45 x 1.0
CASE 517AQ
3M
SC−88A
DF SUFFIX
CASE 419A
5
AW M G
G
1
M = Date Code*
G = Pb−Free Package
(Note: Microdot may be in either location)
*Date Code orientation and/or position may vary
depending upon manufacturing location.
IN B 1
IN A 2
5 VCC
GND 3
4 OUT Y
SC−88A
Figure 1. Pinout (Top View)
PIN ASSIGNMENT
SOT−953 SC−88A UDFN6
1
IN A IN B
IN A
2
GND
IN A
IN B
3
IN B GND
GND
4
OUT Y OUT Y
OUT Y
5
VCC
VCC
NC
6 VCC
FUNCTION TABLE
Input
Output
AB Y
LLH
LHH
HL H
HH L
© Semiconductor Components Industries, LLC, 2014
March, 2014 − Rev. 4
ORDERING INFORMATION
See detailed ordering and shipping information on page 5 of
this data sheet.
1 Publication Order Number:
NL17SG00/D


  ON Semiconductor Electronic Components Datasheet  

NL17SG00 Datasheet

Single 2-Input NAND Gate

No Preview Available !

NL17SG00
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
IGND
TSTG
TL
TJ
MSL
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Output at High or Low State
Power−Down Mode (VCC = 0 V)
DC Input Diode Current
DC Output Diode Current
DC Output Source/Sink Current
VIN < GND
VOUT < GND
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Moisture Sensitivity
−0.5 to +5.5
−0.5 to +4.6
−0.5 to VCC +0.5
−0.5 to +4.6
−20
−20
±20
±20
±20
−65 to +150
260
+150
Level 1
V
V
V
mA
mA
mA
mA
mA
°C
°C
°C
FR
VESD
Flammability Rating
ESD Withstand Voltage
Oxygen Index: 28 to 34
Human Body Model (Note 2)
Machine Model (Note 3)
UL 94 V−0 @ 0.125 in
>1500
>100
V
ILATCHUP Latchup Performance Above VCC and Below GND at 125°C (Note 4)
±100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
Min Max Unit
VCC Positive DC Supply Voltage
0.9 3.6 V
VIN Digital Input Voltage
0.0 3.6 V
VOUT
Output Voltage
Output at High or Low State
Power−Down Mode (VCC = 0 V)
0.0
0.0
VCC
V
3.6
TA Operating Temperature Range
−55
+125
°C
Dt / DV Input Transition Rise or Fail Rate
VCC = 3.3 V ± 0.3 V
0
10 ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
http://onsemi.com
2


Part Number NL17SG00
Description Single 2-Input NAND Gate
Maker ON Semiconductor
Total Page 9 Pages
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