Qualifications: The product qualification test plan is based on the guidelines of AEC-Q101-REV-C,
Stress Test Qualification for Automotive Grade Discrete Semiconductors.
ESD: 2 kV acc. to ANSI/ESDA/JEDEC JS-001 (HBM, Class 2).
Full PDF Text Transcription for BPW34FASR (Reference)
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Prowdwuwk.todsartaemn-bolast.tco|mVersion 1.1 BPW 34 FASR BPW 34 FASR DIL SMT Silicon PIN Photodiode with Daylight Filter; in SMT as Reverse Gullwing Applications ——Rai...
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de with Daylight Filter; in SMT as Reverse Gullwing Applications ——Rain Sensors Features: ——Package: black epoxy ——Qualifications: The product qualification test plan is based on the guidelines of AEC-Q101-REV-C, Stress Test Qualification for Automotive Grade Discrete Semiconductors. ——ESD: 2 kV acc. to ANSI/ESDA/JEDEC JS-001 (HBM, Class 2) ——Especially suitable for applications from 730 nm to 1100 nm ——Short switching time (typ. 20 ns) ——DIL plastic package with high packing density ——Suitable for reflow soldering Ordering Information Type Photocurrent 1) Photocurrent Ordering Code typ.
BPW34FASR Datasheet
