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Toshiba Electronic Components Datasheet

TC4011BF Datasheet

Quad 2 Input NAND Gate

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TC4011BP/BF/BFT
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC4011BP, TC4011BF, TC4011BFT
TC4011B Quad 2 Input NAND Gate
The TC4011B is 2-input positive logic NAND gate respectively.
Since all the outputs of these gates are provided with the
inverters as buffers, the input/output characteristics have been
improved and the variation of propagation delay time due to the
increase in load capacity is kept down to the minimum.
Pin Assignment
TC4011BP
A1 1
B1 2
X1 3
X2 4
B2 5
A2 6
VSS 7
(top view)
Logic Diagram
A
B
14 VDD
13 A4
12 B4
11 X4
10 X3
9 B3
8 A3
X = AB
X
TC4011BF
TC4011BFT
Weight
DIP14-P-300-2.54
SOP14-P-300-1.27A
TSSOP14-P-0044-0.65A
: 0.96 g (typ.)
: 0.18 g (typ.)
: 0.06 g (typ.)
Start of commercial production
1978-06
1 2014-03-01


Toshiba Electronic Components Datasheet

TC4011BF Datasheet

Quad 2 Input NAND Gate

No Preview Available !

Absolute Maximum Ratings (Note)
TC4011BP/BF/BFT
Characteristics
Symbol
Rating
Unit
DC supply voltage
Input voltage
Output voltage
DC input current
Power dissipation
Operating temperature range
Storage temperature range
VDD
VIN
VOUT
IIN
PD
Topr
Tstg
VSS 0.5 to VSS + 20
VSS 0.5 to VDD + 0.5
VSS 0.5 to VDD + 0.5
±10
300 (DIP)/180 (SOP)
40 to 85
65 to 150
V
V
V
mA
mW
°C
°C
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Operating Ranges (VSS = 0 V) (Note)
Characteristics
Symbol
Test Condition
Min Typ. Max Unit
DC supply voltage
Input voltage
VDD
VIN
3 18 V
0 VDD V
Note: The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VDD or VSS.
2 2014-03-01


Part Number TC4011BF
Description Quad 2 Input NAND Gate
Maker Toshiba
PDF Download

TC4011BF Datasheet PDF






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1 TC4011BF Quad 2 Input NAND Gate
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2 TC4011BFT Quad 2 Input NAND Gate
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3 TC4011BP Quad 2 Input NAND Gate
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