Absolute Maximum Ratings (Ta = 25°C)
TC75W56L8X
Characteristic
Symbol
Rating
N
Supply voltage
Differential input voltage
Input voltage
Output current
Power Dissipation
Operating temperature
Storage temperature
VDD, VSS
±3.5 or 7
V
ΔVIN
±7
V
VIN
VSS to VDD
V
IOUT
±35
mA
PD
300 (Note1)
mW
Topr
−40 to 85
°C
Tstg
−55 to 125
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note: Since this product sometimes brings about latchcap, which is peculiar to CMOS devices, note the following
points:
• Don’t raise the voltage level of I/O pins beyond VDD, nor lower it below VSS.
Consider the timing for power supply, too.
• Don’t let any abnormal noise enter the device.
Note1: Mounted on an FR4 board.
2
2014-03-01
