TCR2LN115
TCR2LN115 is 200mA CMOS Low Dropout Regulator manufactured by Toshiba.
- Part of the TCR2LN08 comparator family.
- Part of the TCR2LN08 comparator family.
feature overcurrent protection and auto-discharge option.
The TCR2LN series is offered in the ultra small plastic mold package SDFN4/SDFN4E (0.8 mm x 0.8 mm x 0.38 mm) and has a low dropout voltage of 250 m V (2.5 V output, IOUT = 150 m A). As small ceramic input and output capacitors 0.1 μF can be used with the TCR2LN series, these devices are ideal for portable applications that require high-density board assembly such as cellular phones.
Weight : 0.6 mg ( typ.)
SDFN4/SDFN4E
Features
- Low quiescent bias current (IB = 2 μA (max) at IOUT = 0 m A, Tj = -40 to 85 °C)
- Low dropout voltage
VDO = 250 m V (typ.) at 2.5 V-output, IOUT = 150 m A
- Wide range output voltage line up (VOUT = 0.8 to 3.6 V)
- High VOUT accuracy ±1.0 % (1.8 V ≤ VOUT)
- Overcurrent protection
- Auto-discharge
- Pull down connection between CONTROL and GND
- Ceramic capacitors can be used (CIN = 0.1 μF, COUT = 0.1 μF)
- Ultra small package SDFN4 (0.8 mm x 0.8 mm x 0.38 mm)
© 2021
Toshiba Electronic Devices & Storage Corporation
Start of mercial production
2014-08
2021-08-31
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Input voltage Control voltage Output voltage Output current Power dissipation Operating temperature range Junction temperature Storage temperature range
Symbol
VIN VCT VOUT IOUT PD Topr
Tj Tstg
Rating
6.0 -0.3 to 6.0 -0.3 to VIN + 0.3
200 300 (Note1)
- 40 to 85 150
- 55 to 150
TCR2LN series
Unit V V V m A m W °C °C °C
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data...