Datasheet4U Logo Datasheet4U.com

ADC12D1600QML - RF-Sampling ADC

General Description

The ADC12D1600QML is a low power, high performance CMOS analog-to-digital converter that digitizes signals at a 12-bit resolution at sampling rates up to 3.2 GSPS in an interleaved mode.

It can also be used as a dual channel ADC for sampling rates up to 1.6 GSPS.

Key Features

  • 1.
  • 2 Total Ionizing Dose (TID) to 300 krad(Si).
  • Single Event Latch-up (SEL) > 120 MeV- cm2/mg.
  • Wide Temperature Range -55°C to +125°C.
  • Low Power Consumption.
  • R/W SPI for Extended Control Mode or Simple Pin Control Mode.
  • Interleaved Timing Automatic with Manual Skew Adjust.
  • Auto-Sync Function for Multi-Chip Systems.
  • Time Stamp Feature to Capture External Trigger.
  • Test Patterns at Output for System Debug.
  • 1:1.

📥 Download Datasheet

📁 Similar Datasheet

Part Number Description Manufacturer
ADC12D1600 2.0/3.2 GSPS Ultra High-Speed ADC National Semiconductor
ADC12D1000 2.0/3.2 GSPS Ultra High-Speed ADC National Semiconductor
ADC12D1800 Single 3.6 GSPS ADC National Semiconductor
ADC12D040 Dual 12-Bit 40MSPS 600mW A/D Converter National Semiconductor
ADC12DL040 210mW A/D Converter National Semiconductor

Other Datasheets by Texas Instruments

Part Number Description
ADC12D1600 Ultra High-Speed ADC
ADC12D1600RF RF-Sampling ADC
ADC12D1000 Ultra High-Speed ADC
ADC12D1000RF RF-Sampling ADC
ADC12D1800 Ultra High-Speed ADC

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
ADC12D1600QML www.ti.com SNAS615 – DECMEBER 2012 12-Bit, Single or Dual, 3200/1600/800 MSPS RF Sampling ADC FEATURES 1 •2 Total Ionizing Dose (TID) to 300 krad(Si) • Single Event Latch-up (SEL) > 120 MeV- cm2/mg • Wide Temperature Range -55°C to +125°C • Low Power Consumption • R/W SPI for Extended Control Mode or Simple Pin Control Mode • Interleaved Timing Automatic with Manual Skew Adjust • Auto-Sync Function for Multi-Chip Systems • Time Stamp Feature to Capture External Trigger • Test Patterns at Output for System Debug • 1:1 Non-Demuxed or 1:2 or 1:4 Parallel Demuxed LVDS Outputs • Single 1.