ADS5520
ADS5520 is Analog-to-Digital Converters manufactured by Texas Instruments.
FEATURES
- 2 12-Bit Resolution
- 125 MSPS Sample Rate
- High SNR: 69.7 d BFS at 100 MHz f IN
- High SFDR: 82 d Bc at 100 MHz f IN
- 2.3-VPP Differential Input Voltage
- Internal Voltage Reference
- 3.3-V Single-Supply Voltage
- Analog Power Dissipation: 578 m W
- Serial Programming Interface
- TQFP-64 Power PAD™ Package
- Remended Op Amps:
THS3201, THS3202, THS4503, THS4509,
THS9001, OPA695, OPA847
APPLICATIONS
- Wireless munication
- munication Receivers
- Base Station Infrastructure
- Test and Measurement Instrumentation
- Single and Multichannel Digital Receivers
- munication Instrumentation
- Radar
- Infrared
- Video and Imaging
- Medical Equipment
DESCRIPTION
The ADS5520 is a high-performance, 12-Bit, 125 MSPS analog-to-digital converter (ADC). To provide a plete converter solution, it includes a high-bandwidth linear sample-and-hold stage (S&H) and internal reference. Designed for applications demanding the highest speed and highest dynamic performance in little space, the ADS5520 has excellent power consumption of 578 m W at 3.3-V single-supply voltage. This allows an even higher system integration density. The provided internal reference simplifies system design requirements. Parallel CMOS-patible output ensures seamless interfacing with mon logic.
The ADS5520 is available in a 64-pin TQFP Power PAD package over the industrial temperature range.
12 Bit 14 Bit
Table 1. ADS5500 Product Family
80 MSPS ADS5522 ADS5542
105 MSPS ADS5521 ADS5541
125 MSPS ADS5520 ADS5500
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. Power PAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all...