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CD74HC08-EP Datasheet Quadruple 2-input Positive-and Gates

Manufacturer: Texas Instruments

Overview: CD74HC08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATES D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of Up To −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Buffered Inputs D Typical Propagation Delay 7 ns at VCC = 5 V, CL = 15 pF, TA = 25°C D Fanout (Over Temperature Range) − Standard Outputs . . . 10 LSTTL Loads − Bus Driver Outputs . . . 15 LSTTL Loads † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

General Description

/ordering information The CD74HC08 logic gates utilize silicon-gate CMOS technology to achieve operating speeds similar to LSTTL gates, with the low power consumption of standard CMOS integrated circuits.

All devices can drive 10 LSTTL loads.

ORDERING INFORMATION TA PACKAGE‡ ORDERABLE PART NUMBER TOP-SIDE MARKING −40°C to 125°C SOIC − M Tape and reel CD74HC08QM96EP HC08QEP −55°C to 125°C SOIC − M Tape and reel CD74HC08MM96EP§ HC08MEP ‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package.

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