LM2902-EP Datasheet | Texas Instruments

FEATURES - Controlled Baseline - One Assembly/Test Site, One Fabrication Site - Extended Temperature Performance of -55°C to 125°C - Enhanced Diminishing Manufacturing Sources (DMS) Support - Enhanced Product-Change Notification - Qualification Pedigree (1) ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such qualification testing should not be viewed as justifying use of this ponent beyond specified performance and environmental limits. - ESD Protection <500 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model C = 200 p F, R = 0); 1500 V Using Charged Device Model - ESD Human Body Model >2 k V Machine Model >200 V and Charge Device Model = 2 k V For K-Suffix Devices. - Low Supply-Current Drain Independent of Supply Voltage . . . 0.8 m A Typ - Low Input Bias and Offset Parameters: - Input Offset Voltage . . . 3 m V Typ - Input Offset Current . . . 2 n A Typ - Input Bias Current . . . 20 n A Typ - mon-Mode Input Voltage Range Includes Ground, Allowing Direct Sensing Near Ground - Differential Input Voltage Range Equal to Maximum-Rated Supply Voltage: - Non-V devices . . . 26 V - V-Suffix devices . . . 32 V - V-Suffix devices . . . 32 V D Open-Loop Differential Voltage Amplification . . . 100 V/m V Typ - Internal Frequency pensation D OR PW PACKAGE (TOP VIEW) 1OUT 1 1IN- 2 1IN+ 3 VCC 4 2IN+ 5 2IN- 6 2OUT 7 14 4OUT 13 4IN- 12 4IN+ 11 GND 10 3IN+ 9 3IN- 8 3OUT DESCRIPTION This device consists of four independent high-gain frequency-pensated operational amplifiers that are designed specifically to operate from a single supply over a wide range of voltages. Operation from split supplies is possible when the difference between the two supplies is 3 V to 26 V (3 V to 32 V for...