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SN65472-EP Datasheet Preview

SN65472-EP Datasheet

DUAL PERIPHERAL DRIVER

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SN65472-EP
www.ti.com
SLRS061 – SEPTEMBER 2013
DUAL PERIPHERAL DRIVER
Check for Samples: SN65472-EP
FEATURES
1
• Characterized for Use up to 300 mA
• High-Voltage Outputs
• No Output Latch-Up at 55 V
(After Conducting 300 mA)
• Medium-Speed Switching
• Circuit Flexibility for Varied Applications and
Choice of Logic Function
• TTL-Compatible Diode-Clamped Inputs
• Standard Supply Voltages
SUPPORTS INDUSTRIAL APPLICATIONS
• Controlled Baseline
• One Assembly and Test Site
• One Fabrication Site
• Available in Extended (–40°C to 125°C)
Temperature Ranges (1)
• Extended Product Life Cycle
• Extended Product-Change Notification
• Product Traceability
D PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
GND 4
8 VCC
7 2B
6 2A
5 2Y
(1) Custom temperature ranges available
DESCRIPTION/ORDERING INFORMATION
The SN65472 dual peripheral driver is functionally interchangeable with series SN75452B and series SN75462
peripheral drivers, but is designed for use in systems that require higher breakdown voltages than either of those
series can provide at the expense of slightly slower switching speeds than series 75452B (limits are the same as
series SN75462). Typical applications include high-speed logic buffers, power drivers, relay drivers, lamp drivers,
MOS drivers, line drivers, and memory drivers.
The SN65472 is a dual peripheral NAND driver (assuming positive logic), with the output of the logic gates
internally connected to the bases of the npn output transistors.
This device is characterized for operation from -40°C to 125°C.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated




etcTI

SN65472-EP Datasheet Preview

SN65472-EP Datasheet

DUAL PERIPHERAL DRIVER

No Preview Available !

SN65472-EP
SLRS061 – SEPTEMBER 2013
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
TJ
-40°C to 125°C
ORDERING INFORMATION(1)
PACKAGE (2)
ORDERABLE PART NUMBER
SOIC D
Tape of 75
Reel of 2500
SN65472DEP
SN65472DREP
TOP-SIDE MARKING
65472
65472
VID NUMBER
V62/13618-01XE-T
V62/13618-01XE
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
1
1A
2
1B
6
2A
7
2B
LOGIC SYMBOL
&
This symbol is in accordance with
ANSI/IEEE Std 91-1984 and IEC
Publication 617-12.
3
1Y
5
2Y
LOGIC DIAGRAM (POSITIVE LOGIC)
1
1A
2
1B
6
2A
7
2B
3
1Y
5
2Y
4
GND
Table 1. FUNCTION TABLE
(EACH DRIVER)
INPUTS
A
B
L
L
L
H
H
L
H
H
Y (1)
H (Off state)
H (Off state)
H (Off state)
L (On state)
(1) positive logic: Y = AB or A + B
SCHEMATIC (EACH DRIVER)
4 k
1.6 k
1.6 k
130
VCC
A
B
1 k
Resistor values shown are nominal.
1 k
Y
500
GND
2
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Product Folder Links: SN65472-EP
Copyright © 2013, Texas Instruments Incorporated


Part Number SN65472-EP
Description DUAL PERIPHERAL DRIVER
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