SLLSEG8A – AUGUST 2013 – REVISED AUGUST 2013
Fault-Protected RS-485 Transceivers With Extended Common-Mode Range
Check for Samples: SN65HVD1792-EP
• Bus-Pin Fault Protection to > ±70 V
• Common-Mode Voltage Range (–20 V to 25 V)
More Than Doubles TIA/EIA 485 Requirement
• Bus I/O Protection
– ±16 kV JEDEC HBM Protection
• Reduced Unit Load for Up to 256 Nodes
• Failsafe Receiver for Open-Circuit, Short-
Circuit and Idle-Bus Conditions
• Low Power Consumption
– Low Standby Supply Current, 1 μA Typ
– ICC 5 mA Quiescent During Operation
• Power-Up, Power-Down Glitch-Free Operation
• Designed for RS-485 and RS-422 Networks
SUPPORTS DEFENSE, AEROSPACE,
AND MEDICAL APPLICATIONS
• Controlled Baseline
• One Assembly and Test Site
• One Fabrication Site
• Extended Product Life Cycle
• Extended Product-Change Notification
• Product Traceability
The SN65HVD1792 is designed to survive overvoltage faults such as direct shorts to power supplies, mis-wiring
faults, connector failures, cable crushes, and tool mis-applications. It is also robust to ESD events, with high
levels of protection to human-body model specifications.
The SN65HVD1792 combines a differential driver and a differential receiver, which operate from a single power
supply. The SN65HVD1792 is characterized from –40°C to 105°C.
VFAULT up to 70 V
–40°C to 105°C
SOIC - D
ORDERABLE PART NUMBER
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated