Datasheet Summary
SN54ABT8245, SN74ABT8245
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SCBS124D
- AUGUST 1992
- REVISED DECEMBER 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D patible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D Functionally Equivalent to ’F245 and
’ABT245 in the Normal-Function Mode
D SCOPE ™ Instruction Set:
- IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
- Parallel-Signature Analysis at Inputs With Masking Option
- Pseudo-Random Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Binary Count From Outputs
- Even-Parity Opcodes
D Two Boundary-Scan Cells...