• Part: SN74ABTH182504A
  • Description: SCAN TEST DEVICES
  • Manufacturer: Texas Instruments
  • Size: 874.48 KB
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Datasheet Summary

SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C - AUGUST 1993 - REVISED JULY 1996 D Members of the Texas Instruments SCOPE™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D patible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D UBT ™ (Universal Bus Transceiver) bines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode D Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors D B-Port Outputs of ’ABTH182504A Devices Have Equivalent 25-Ω Series Resistors, So No...