Datasheet Summary
SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C
- AUGUST 1993
- REVISED JULY 1996
D Members of the Texas Instruments
SCOPE™ Family of Testability Products
D Members of the Texas Instruments
Widebus™ Family
D patible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D UBT ™ (Universal Bus Transceiver) bines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
D B-Port Outputs of ’ABTH182504A Devices
Have Equivalent 25-Ω Series Resistors, So No...