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SN74ABTH182646A - SCAN TEST DEVICES

Download the SN74ABTH182646A datasheet PDF (SN74ABTH18646A included). The manufacturer datasheet provides complete specifications, pinout details, electrical characteristics, and typical applications for scan test devices.

Description

The ’ABTH18646A and ’ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

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Note: The manufacturer provides a single datasheet file (SN74ABTH18646A-etcTI.pdf) that lists specifications for multiple related part numbers.

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Full PDF Text Transcription

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SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D – AUGUST 1993 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D Compatible With the IEEE Standard 1149.
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