Datasheet Summary
SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A SCAN TEST DEVICES WITH
18ĆBIT BUS TRANSCEIVERS AND REGISTERS SCBS167D
- AUGUST 1993
- REVISED JULY 1996
D Members of the Texas Instruments
SCOPE Family of Testability Products
D Members of the Texas Instruments
Widebus Family
D patible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D Include D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
D B-Port Outputs of ’ABTH182652A Devices
Have Equivalent 25-Ω Series Resistors, So No External Resistors Are...