SN74ABTH18502A, SCAN TEST DEVICES
The ’ABTH18502A and ’ABTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblie
SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS164E * AUGUST 1993 * REVISED DECEMBER 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for
