SN74ABTH18646A Datasheet - Texas Instruments

SCAN TEST DEVICES

SN74ABTH18646A General Description

The ’ABTH18646A and ’ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board ass.

SN74ABTH18646A Datasheet (883.32 KB)

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SN74ABTH18646A

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Texas Instruments ↗

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883.32 KB

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Scan test devices.
SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D AUGUST 19.

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SN74ABTH18646A General Description

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