SN74ABTH18652A - SCAN TEST DEVICES
The ’ABTH18652A and ’ABTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board asse
SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A SCAN TEST DEVICES WITH 18ĆBIT BUS TRANSCEIVERS AND REGISTERS SCBS167D * AUGUST 1993 * REVISED JULY 1996 D Members of the Texas Instruments SCOPE Family of Testability Products D Members of the Texas Instruments Widebus Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission
File Size:
889.99 KB
Description:
Scan test devices.
