• Part: SN74ABTH18652A
  • Description: SCAN TEST DEVICES
  • Manufacturer: Texas Instruments
  • Size: 889.99 KB
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Datasheet Summary

SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A SCAN TEST DEVICES WITH 18ĆBIT BUS TRANSCEIVERS AND REGISTERS SCBS167D - AUGUST 1993 - REVISED JULY 1996 D Members of the Texas Instruments SCOPE  Family of Testability Products D Members of the Texas Instruments Widebus  Family D patible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors D B-Port Outputs of ’ABTH182652A Devices Have Equivalent 25-Ω Series Resistors, So No External Resistors Are...