16-BIT BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCAS677A – MAY 2002 – REVISED JULY 2002
D Controlled Baseline
– One Assembly/Test Site, One Fabrication
D Extended Temperature Performance of
–40°C to 125°C
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product Change Notification
D Qualification Pedigree†
D Member of the Texas Instruments
D Inputs Are TTL-Voltage Compatible
D 3-State Outputs Drive Bus Lines Directly
D Flow-Through Architecture Optimizes PCB
D Distributed VCC and GND Pins Minimize
High-Speed Switching Noise
† Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, highly
accelerated stress test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life.
The SN74ACT16245Q-EP is a 16-bit bus
transceiver organized as dual-octal noninverting
3-state transceivers and designed for
asynchronous two-way communication between
data buses. The control-function implementation
minimizes external timing requirements.
The device allows data transmission from the A bus to the B bus or from the B bus to the A bus, depending on
the logic level at the direction-control (DIR) input. The enable (G) input can be used to disable the devices so
that the buses are effectively isolated.
–40°C to 125°C SSOP – DL
Tape and reel
‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright 2002, Texas Instruments Incorporated
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