Texas Instruments SN74ACT8990
The ’ACT8990 test-bus controllers (TBC) are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of components supports IEEE Standard 1149.1-1990 (JTAG) boundary scan to facilitate testing of complex circuit-board assemblies.SN54ACT8990, SN74ACT8990 TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES SCAS190E – JUNE 1990 – REVISED JANUARY 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Control Operation of Up to Six Parallel Target Scan Paths D Accommodate Pipeline Delay to Target of Up to 31 Clock Cycles D Scan Data Up to 232 Clock Cycles D Execute Instructions for Up to 232 Clock Cycles D Each Device Includes Four Bidirectional Event Pins for Additional Test Capability D Inputs Are TTL-Voltage Compatible D EPIC ™ (Enhanced-Performance Implanted CMOS) 1-µm Process D Packaged in 44-Pin Plastic Leaded Chip Carrier (FN), 68-Pin Ceramic Pin Grid Array (GB), and 68-Pin Ceramic Quad Flat Packages (HV) description The ’ACT8990 differ from other SCOPE™ integrated circuits. Their function is to control the JTAG serial-test bus rather than being target boundary -scannable devices.