Datasheet4U Logo Datasheet4U.com

SN74HC273D - Octal D-Type Flip-Flops

Download the SN74HC273D datasheet PDF. This datasheet also covers the SN74HC273 variant, as both devices belong to the same octal d-type flip-flops family and are provided as variant models within a single manufacturer datasheet.

General Description

The SNx4HC273 devices are positive-edge-triggered D-type flip-flops with a direct active low clear ( CLR) input.

Information at the data (D) inputs meeting the setup time requirements is transferred to the Q outputs on the positive-going edge of the clock (CLK) pulse.

Key Features

  • Wide operating voltage range of 2 V to 6 V.
  • Outputs can drive up to 10 LSTTL loads.
  • Low power consumption, 80-µA maximum ICC.
  • Typical tpd = 12 ns.
  • ±4-mA output drive at 5 V.
  • Low input current of 1-µA maximum.
  • Contain eight flip-flops with single-rail outputs.
  • Direct clear input.
  • Individual data input to each flip-flop.
  • On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted.

📥 Download Datasheet

Note: The manufacturer provides a single datasheet file (SN74HC273-etcTI.pdf) that lists specifications for multiple related part numbers.

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
SN54HC273, SN74HC273 SCLS136F – DECEMBER 1982 – REVISED APRIL 2022 SNx4HC273 Octal D-Type Flip-Flops With Clear 1 Features • Wide operating voltage range of 2 V to 6 V • Outputs can drive up to 10 LSTTL loads • Low power consumption, 80-µA maximum ICC • Typical tpd = 12 ns • ±4-mA output drive at 5 V • Low input current of 1-µA maximum • Contain eight flip-flops with single-rail outputs • Direct clear input • Individual data input to each flip-flop • On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters.