D Controlled Baseline
− One Assembly/Test Site, One Fabrication
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification
D Qualification Pedigree†
D Operating Voltage Range of 4.5 V to 5.5 V
D Outputs Can Drive Up To 10 LSTTL Loads
† Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
SCLS561 − JANUARY 2004
D Low Power Consumption, 20-µA Max ICC
D Typical tpd = 13 ns
D ±4-mA Output Drive at 5 V
D Low Input Current of 1 µA Max
D Inputs Are TTL-Voltage Compatible
This device contains six independent inverters. It performs the Boolean function Y = A in positive logic.
−40°C to 85°C SOIC − D
Reel of 2500 SN74HCT04IDREP
‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
logic diagram (positive logic)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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