• Member of the Texas Instruments Widebus™
• Operates From 1.65 V to 3.6 V
• Inputs Accept Voltages to 5.5 V
• Max tpd of 3.7 ns at 3.3 V
• Typical VOLP (Output Ground Bounce)
<0.8 V at VCC = 3.3 V, TA = 25°C
• Typical VOHV (Output VOH Undershoot)
>2 V at VCC = 3.3 V, TA = 25°C
• Ioff Supports Partial-Power-Down Mode
• Supports Mixed-Mode Signal Operation on All
Ports (5-V Input/Output Voltage
With 3.3-V VCC)
• Bus Hold on Data Inputs Eliminates the Need
for External Pullup/Pulldown Resistors
• Latch-Up Performance Exceeds 250 mA Per
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 1000-V Charged-Device Model (C101)
WITH 3-STATE OUTPUTS
SCAS569H – MARCH 1996 – REVISED MARCH 2005
DGG, DGV, OR DL PACKAGE
This 16-bit buffer/driver is designed for 1.65-V to 3.6-V VCC operation and provides a high-performance bus
interface for wide data paths.
The 3-state control gate is a 2-input AND gate with active-low inputs so that, if either output-enable (OE1 or OE2)
input is high, all corresponding outputs are in the high-impedance state.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators
in a mixed 3.3-V/5-V system environment.
Active bus-hold circuitry holds unused or undriven inputs at a valid logic state. Use of pullup or pulldown resistors
with the bus-hold circuitry is not recommended.
–40°C to 85°C
ORDERABLE PART NUMBER
SSOP – DL
Tape and reel
TSSOP – DGG Tape and reel
TVSOP – DGV Tape and reel
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1996–2005, Texas Instruments Incorporated