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SN74LVTH32374ĆEP 3.3ĆV ABT 32ĆBIT EDGEĆTRIGGERED DĆTYPE FLIPĆFLOP
WITH 3ĆSTATE OUTPUTS SCBS795 − DECEMBER 2003
D Controlled Baseline
− One Assembly/Test Site, One Fabrication Site
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification D Qualification Pedigree† D State-of-the-Art Advanced BiCMOS
Technology (ABT) Design for 3.3-V Operation and Low Static-Power Dissipation
† Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.