TLV2774A-Q1
TLV2774A-Q1 is 2.7-V High-Slew-Rate Rail-to-Rail Output Op Amps manufactured by Texas Instruments.
- Part of the TLV2770-Q1 comparator family.
- Part of the TLV2770-Q1 comparator family.
description
The TLV277x CMOS operational amplifier family bines high slew rate and bandwidth, rail-to-rail output swing, high output drive, and excellent dc-precision. The device provides 10.5 V/µs of slew rate and 5.1 MHz of bandwidth while only consuming 1 m A of supply current per channel. This ac-performance is much higher than current petitive CMOS amplifiers. The rail-to-rail output swing and high output drive make these devices a good choice for driving the analog input or reference of analog-to-digital converters. These devices also have low distortion while driving a 600-Ω load for use in tele systems.
These amplifiers have a 360-µV input offset voltage, a 17 n V/√Hz input noise voltage, and a 2-p A input bias current for measurement, medical, and industrial applications. The TLV277x family is also specified across an extended temperature range (- 40°C to 125°C), making it useful for automotive systems.
These devices operate from a 2.5-V to 5.5-V single supply voltage and are characterized at 2.7 V and 5 V. The single-supply operation and low power consumption make these devices a good solution for portable applications. The following table lists the packages available.
DEVICE
TLV2770 TLV2771 TLV2772 TLV2773 TLV2774 TLV2775
NUMBER OF
CHANNELS 1 1 2 2 4 4
FAMILY PACKAGE TABLE
PACKAGE TYPES
SHUTDOWN SOIC TSSOP SOT-23
- -
Yes
- 5
- 8
- -
- -
Yes
- -
- Yes
UNIVERSAL EVM BOARD
See the EVM Selection Guide
(SLOU060)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
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